WarpStack predicts thermal warpage for advanced 2.5D and 3D chiplet packages. Run a fast 2D analysis to screen a whole design space in seconds, then switch to a detailed 3D analysis for accurate sign-off on the trickiest multi-layer stacks — all from the same floorplan, in one tool.
Stacking silicon, interposers, and memory bonds materials with very different expansion rates. As the assembly heats and cools, those mismatches make the whole package bow and twist — and that warpage is a first-order reliability risk in modern 2.5D and 3D integration.
Every material in the stack expands by a different amount. Cycle the package from assembly to operating temperature and those mismatches build internal stress that warps the whole structure.
Too much bow leads to cracked dies, delaminated layers, and open solder joints — and it makes assembly yield fall. Catching it early is far cheaper than finding it on the line.
Floorplanning, stack-up choices, and material selection all change how a package warps. Designers need a warpage answer on every iteration — not once, at the very end.
WarpStack pairs a fast 2D warpage solver for rapid screening with a detailed 3D solver for accurate sign-off — both driven from the same simple design description, so you can move between speed and accuracy without changing your inputs.
The fast 2D analysis returns a full warpage map in about a third of a second — the same speed whether the design has 3 layers or 11. Sweep hundreds of floorplans and stack-ups without waiting.
The detailed 3D analysis resolves the package through its full thickness, layer by layer — the fidelity you want for complex, interleaved multi-layer stacks where a fast estimate isn't enough.
Handles arbitrary layer stacks — substrates, interposers, bumps, dies, spreaders, lids — with per-layer materials and per-die placement. Validated on designs from 3 to 11 layers and 10 to 18 dies.
Every run produces warpage heatmaps, cross-sections, and a 3D stack view, plus the peak-to-peak bow in microns — so the shape and the number are both easy to read.
A built-in compare mode runs both solvers and shows exactly where they agree and where they differ — so you know which designs the fast 2D can screen and which ones truly need 3D.
A command-line interface and structured JSON in, CSV/JSON out make WarpStack easy to script — run one design or a whole batch, and feed the results straight into your own design flow.
WarpStack is designed to drop straight into agentic EDA and system-design workflows. A first-class CLI and structured data interface let autonomous design agents call fast 2D or detailed 3D warpage analysis, read back machine-readable warpage maps and peak-to-peak margins, and feed them into floorplanning, stack-up, and material-selection loops — for warpage-aware optimization and warpage reliability sign-off of chiplets and advanced packages in system design.
Warpage analysis becomes a callable step inside your agentic flow — not a hand-run GUI task.
You describe the package once — its layers, materials, and where each die sits. WarpStack builds a mechanical model of the stack, applies the thermal load, and solves for how the surface deflects. Pick the fast 2D method for screening or the detailed 3D method for accuracy; the inputs are identical.
A single structured file lists the layer stack, each layer's material, and the placement of every die or module — the whole design in one place.
WarpStack takes the package from its stress-free assembly temperature down to operating temperature, so the expansion mismatches between layers turn into real bending.
A finite-element solver computes how the surface deflects across the package. Choose the fast 2D method or the detailed 3D method — same inputs, different fidelity.
Out come warpage heatmaps, cross-sections, and the peak-to-peak bow in microns — ready to view, compare, or drop into your own scripts.
Reduces the stack to an equivalent laminate and solves the bow on a plane. The lowest-cost warpage estimate — ideal for sweeping many designs.
Meshes the package as a full 3D solid, resolving every layer through its thickness. The fidelity to trust for complex interleaved stacks.
The two solvers are built to work together. Use the fast 2D analysis to explore — it screens an entire design space in the time a single 3D run would take. Then reach for the detailed 3D analysis on the designs that matter most, where the layers interleave in ways a flat model can't fully capture. Same floorplan, same materials — you simply choose how much detail you need.
Warpage is reported as peak-to-peak deflection in microns, alongside the full surface map for every run.
Below is a batch of nine 2.5D and 3D benchmark designs — from a simple 3-layer module to an 11-layer 3D chiplet — each solved with both methods. The pattern is consistent: 2D is fast enough to run on everything, and for a large share of designs it already lands close to the 3D answer.
| Design | Layers | Dies | 2D time |
|---|---|---|---|
| 3-layer module | 3 | 12 | 0.342 s |
| Planar 16-die array | 3 | 16 | 0.347 s |
| Arbitrary-layer module | 5 | 12 | 0.345 s |
| GaAs RF PA array | 5 | 15 | 0.347 s |
| HBM3 memory stack | 6 | 10 | 0.346 s |
| 5 nm CPU | 7 | 18 | 0.347 s |
| 2.5D chiplet | 9 | 14 | 0.347 s |
| 11-layer 3D chiplet | 11 | 16 | 0.356 s |
The fast 2D method returns a single, smooth package bow. The 3D method resolves the stack layer by layer, so it reports warpage per surface — the die-level active surface and the continuous package surface — capturing local, die-specific deflection that the flat 2D map averages away.
| Design | 2D | 3D | Agreement |
|---|---|---|---|
| Arbitrary-layer module 5L | 251 µm | 269 µm | 93% |
| 2.5D chiplet 9L | 50 µm | 44 µm | 88% |
| Planar 16-die array 3L | 1465 µm | 1256 µm | 86% |
| HBM3 memory stack 6L | 10.1 µm | 8.3 µm | 83% |
| 16-die array, variant 3L | 1696 µm | 1370 µm | 81% |
WarpStack is in active development. Request access or a walkthrough on your own 2.5D/3D chiplet designs, and we'll get you set up.